Something went wrong inside an advanced semiconductor package. Now comes the challenge: finding where. 🔍
iPHEMOS®-DDX brings seven analysis techniques @ direct tester docking together in one platform to streamline failure analysis.

Something went wrong inside an advanced semiconductor package. Now comes the challenge: finding where. 🔍
iPHEMOS®-DDX brings seven analysis techniques @ direct tester docking together in one platform to streamline failure analysis.
ICYMI: Three Passes Over One Failure #Leadership #DecisionMaking #FailureAnalysis #ProblemSolving #Teamwork
Two-sided failure analysis. One system. Hamamatsu's Dual PHEMOS-X enables top- and bottom-side emission microscopy.