Finding flaws inside dark tubes used to be slow, but lightweight networks excel!

Read the full article on IEEE Sensors Alert.
ieee-sensorsalert.org/articles/a-l...

#ieeesensorsalert #ieeesensors #steelpipeinspection #defectdetection #industrialinspection #computervision #deeplearning

Researchers discuss using machine learning for feature identification to extract parameters and detect nm-scale defects in advanced semiconductor process control, addressing EUV stochastic defects and 3D metrology…

#Semiconductors #MachineLearning #DefectDetection
https://arxiv.org/abs/2610.05812

Machine learning is being applied to feature identification for parameter extraction and defect detectionat the nm scale in advanced semiconductor nodes. The approach addresses3D structure…

#Semiconductors #MachineLearning #DefectDetection #Metrology
https://arxiv.org/abs/2610.05812

📢 New Article in #OpenAccess Journal of — Mechatronics Technology
📜 A multi-perception feature-guided network with dynamic sample matching for bearing surface defect detection
🔎 Xuan Chen, Yongyi Chen, Dan Zhang
🔗 www.elspub.com/doi/10.55092...
#defectdetection #bearings