Demonstrates high-fidelity BEC transport on atom chips using inverse-optimized wire currents. Achieves >99.97% endpoint fidelity via 3D simulations, with surrogate models enabling rapid exploration of transport schedules at multiple atom numbers.

Demonstrates high-fidelity BEC transport on atom chips using inverse-optimized wire currents. Achieves >99.97% endpoint fidelity via 3D simulations, with surrogate models enabling rapid exploration of transport schedules at multiple atom numbers.